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SCANSTA111MT TI IEEE 1149.1 Test Bus Controller | 48-TSSOP | 10MHz, 5V

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产品描述
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Product Overview

The SCANSTA111MT from Texas Instruments is a high-performance IEEE 1149.1 (JTAG) test bus controller designed for automated test equipment (ATE) and boundary-scan applications. It provides a complete solution for controlling multiple scan chains, enabling efficient testing of complex digital systems. Housed in a compact 48-TSSOP package, this device operates at a maximum clock frequency of 10 MHz and supports a wide supply voltage range of 4.5V to 5.5V. The SCANSTA111MT is ideal for applications requiring robust test access and diagnostics, such as 5G base stations, automotive electronics, and industrial control systems.

Detailed Technical Specifications

Parameter Value
Part Number SCANSTA111MT
Manufacturer Texas Instruments (TI)
Package 48-TSSOP
Supply Voltage (VCC) 4.5V to 5.5V
Maximum Clock Frequency 10 MHz
Operating Temperature Range -40°C to +85°C
Interface IEEE 1149.1 (JTAG)
Number of TAP Controllers 1
Scan Chain Support Up to 8 scan chains
Power Consumption Typical 50 mW
ESD Protection 2 kV (HBM)

Key Features

  • Compliant with IEEE 1149.1 standard for boundary-scan testing
  • Supports up to 8 independent scan chains for flexible test architecture
  • High-speed operation up to 10 MHz for fast test execution
  • Wide supply voltage range (4.5V to 5.5V) for compatibility with various systems
  • Low power consumption (50 mW typical) for energy-efficient designs
  • Compact 48-TSSOP package for space-constrained applications
  • Industrial temperature range (-40°C to +85°C) for harsh environments
  • Integrated TAP controller with built-in test logic

Target Applications

  • 5G Base Stations: Used for testing and diagnostics of RF modules, digital signal processors, and power management units in base station equipment.
  • Automotive Electronics: Applied in engine control units (ECUs), advanced driver-assistance systems (ADAS), and infotainment dashboards for boundary-scan testing.
  • Industrial Control Systems: Employed in programmable logic controllers (PLCs), motor drives, and robotics for system-level test and debug.
  • Telecommunications: Utilized in network switches, routers, and optical transport equipment for JTAG-based testing.
  • Medical Devices: Integrated into diagnostic imaging systems and patient monitoring devices for reliable test access.

Global Supply Chain & Wholesale Solutions

At Jasin Chip, we provide professional supply chain and wholesale solutions for SCANSTA111MT. Our core advantages include:

  • 24/7 Global Customer Support: Professional team providing instant quotes and technical support worldwide.
  • In-stock Inventory, Same-day Shipping: We maintain localized stock; orders confirmed before 4 PM are shipped the same day.
  • HK-SZ Synergy, Flexible Settlement: Direct global shipping from Shenzhen with support for HK bank transfers and multi-currency.
  • Escrow Secured Transactions: We support Escrow.com for secure transactions, ensuring peace of mind for batch orders.
  • BOM Kitting & Sampling Services: Specialized sourcing for testing samples and urgent shortage components.

Quality Assurance & Compliance

Jasin Chip guarantees that all delivered products are 100% original factory stock with full quality assurance and traceability.

  • 100% Original & Authentic: All components are guaranteed to be authentic with strict quality control.
  • RoHS Compliant: All electronic components comply with international environmental and safety standards.
  • Original Factory Packaging: We maintain original factory packaging and seals to ensure ESD protection and physical integrity.

產品概述

SCANSTA111MT 是德州儀器(TI)推出的一款高性能 IEEE 1149.1(JTAG)測試匯流排控制器,專為自動測試設備(ATE)和邊界掃描應用設計。它提供完整的解決方案,用於控制多個掃描鏈,實現對複雜數字系統的高效測試。該器件採用緊湊的 48-TSSOP 封裝,最高工作時鐘頻率為 10 MHz,支持 4.5V 至 5.5V 的寬電源電壓範圍。SCANSTA111MT 非常適合需要強大測試訪問和診斷能力的應用,例如 5G 基站、汽車電子和工業控制系統。

詳細技術參數

參數 數值
型號 SCANSTA111MT
製造商 德州儀器 (TI)
封裝 48-TSSOP
電源電壓 (VCC) 4.5V 至 5.5V
最高時鐘頻率 10 MHz
工作溫度範圍 -40°C 至 +85°C
接口 IEEE 1149.1 (JTAG)
TAP 控制器數量 1
掃描鏈支持 最多 8 條掃描鏈
功耗 典型 50 mW
ESD 保護 2 kV (HBM)

核心特性

  • 符合 IEEE 1149.1 標準,用於邊界掃描測試
  • 支持最多 8 條獨立掃描鏈,實現靈活的測試架構
  • 高達 10 MHz 的高速操作,實現快速測試執行
  • 寬電源電壓範圍 (4.5V 至 5.5V),兼容多種系統
  • 低功耗 (典型 50 mW),適合節能設計
  • 緊湊的 48-TSSOP 封裝,適用於空間受限的應用
  • 工業級溫度範圍 (-40°C 至 +85°C),適用於惡劣環境
  • 集成 TAP 控制器,內置測試邏輯

典型應用場景

  • 5G 基站:用於射頻模塊、數字信號處理器和電源管理單元的測試與診斷。
  • 汽車電子:應用於發動機控制單元 (ECU)、高級駕駛輔助系統 (ADAS) 和儀表板,進行邊界掃描測試。
  • 工業控制系統:用於可編程邏輯控制器 (PLC)、電機驅動器和機器人的系統級測試與調試。
  • 電信設備:用於網絡交換機、路由器和光傳輸設備的 JTAG 測試。
  • 醫療設備:集成到診斷成像系統和病人監護設備中,實現可靠的測試訪問。

環球供應鏈與批發合作夥伴方案

在 Jasin Chip,我們為 SCANSTA111MT 提供全面的供應鏈與批發解決方案。 我們的核心優勢包括:

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Trusted Partner for Automotive, Industrial, and Hard-to-find Components.
WhatsApp: +852 5209 9691 | Email: [email protected]

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