SCAN926260TUF TI Test & Measurement IC | 196-NFBGA(15X15) | 26-Channel, 920MHz

Product Overview

The SCAN926260TUF from Texas Instruments is a high-performance 26-channel test and measurement IC designed for automated test equipment (ATE) and semiconductor test systems. Housed in a compact 196-NFBGA (15x15 mm) package, it integrates advanced scan test capabilities with low power consumption and high-speed operation up to 920 MHz. This device enables efficient testing of complex digital ICs, reducing test time and cost.

Detailed Technical Specifications

Key Features

• 26 high-speed scan channels for parallel test
• Supports IEEE 1149.1 and 1149.6 standards
• Low jitter and skew for accurate timing
• Built-in self-test (BIST) capability
• Low power consumption with power-down modes
• Compact 15x15 mm BGA package for space-constrained designs

Target Applications

• Automated Test Equipment (ATE) for semiconductor testing
• 5G base station IC testing
• Automotive electronics test systems (e.g., ADAS, infotainment)
• High-speed memory test (DDR5, HBM)
• FPGA and ASIC validation platforms

Global Supply Chain & Wholesale Solutions

At Jasin Chip, we provide professional supply chain and wholesale solutions for SCAN926260TUF. Our core advantages include:

• 24/7 Global Customer Support: Professional team providing instant quotes and technical support worldwide.
• In-stock Inventory, Same-day Shipping: We maintain localized stock; orders confirmed before 4 PM are shipped the same day.
• HK-SZ Synergy, Flexible Settlement: Direct global shipping from Shenzhen with support for HK bank transfers and multi-currency.
• Escrow Secured Transactions: We support Escrow.com for secure transactions, ensuring peace of mind for batch orders.
• BOM Kitting & Sampling Services: Specialized sourcing for testing samples and urgent shortage components.

Quality Assurance & Compliance

Jasin Chip guarantees that all delivered products are 100% original factory stock with full quality assurance and traceability.

• 100% Original & Authentic: All components are guaranteed to be authentic with strict quality control.
• RoHS Compliant: All electronic components comply with international environmental and safety standards.
• Original Factory Packaging: We maintain original factory packaging and seals to ensure ESD protection and physical integrity.

產品概述

SCAN926260TUF 是德州儀器（TI）推出的一款高性能26通道測試與測量IC，專為自動測試設備（ATE）和半導體測試系統設計。採用緊湊的196-NFBGA（15x15 mm）封裝，集成先進的掃描測試能力，功耗低，工作頻率高達920 MHz。該器件能夠高效測試複雜數字IC，縮短測試時間並降低成本。

詳細技術參數

核心特性

• 26個高速掃描通道，支持並行測試
• 支持IEEE 1149.1和1149.6標準
• 低抖動和偏移，確保精確時序
• 內建自測試（BIST）功能
• 低功耗設計，支持休眠模式
• 緊湊的15x15 mm BGA封裝，適合空間受限設計

典型應用場景

• 半導體測試的自動測試設備（ATE）
• 5G基站IC測試
• 汽車電子測試系統（如ADAS、信息娛樂系統）
• 高速內存測試（DDR5、HBM）
• FPGA和ASIC驗證平台

環球供應鏈與批發合作夥伴方案

在 Jasin Chip，我們為 SCAN926260TUF 提供全面的供應鏈與批發解決方案。 我們的核心優勢包括：

• 全天候環球客戶支援：專業團隊為您提供即時報價及技術支援，無需漫長等待。
• 現貨庫存，即日發貨：確保現貨充足。下午 4 點前確認訂單，即可安排當天寄出。
• 深港聯動，結算靈活：深圳直發全球，物流高效可靠；支援香港銀行戶口轉賬及多幣種結算。
• Escrow 擔保交易：支援 Escrow.com 平台交易，保障買賣雙方權益，小批量訂單亦可安心在線下單。
• BOM 配單與樣板服務：提供樣板測試及認證支援。專注一站式 BOM 配套及緊急缺料採購服務。

品質保證與合規

Jasin Chip 承諾所有出貨產品均為原廠正貨，具備完善的品質保證及產品可追溯性。

• 100% 原廠正貨：承諾所有供應零件均為原裝現貨，品質嚴格把關，來源清晰可追溯。
• 符合 RoHS 認證：所有電子元器件均符合國際環保標準及相關安全認證。
• 原廠封裝保護：嚴格保留原廠原始包裝及封條，確保物流過程中的靜電防護 (ESD) 與物理安全。

以上產品均為原廠正貨，提供 BOM 配單及現貨庫存支援，歡迎查詢。

HONG KONG JASIN SEMICONDUCTOR TECHNOLOGY COMPANY LIMITED
Trusted Partner for Automotive, Industrial, and Hard-to-find Components.
WhatsApp: +852 5209 9691 | Email: [email protected]