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TI SN74ACT8990FNR 44-PLCC(16.58X16.58)

SN74ACT8990FNR TI Test Equipment | 44-PLCC (16.58X16.58) | 10MHz, 5V

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Product Overview

The SN74ACT8990FNR from Texas Instruments is a high-performance test bus controller designed for boundary-scan testing (IEEE Std 1149.1). It provides a complete interface between a host processor and a test access port (TAP) on a target board, enabling efficient testing of digital circuits. Housed in a 44-pin PLCC package (16.58x16.58 mm), this device operates at a maximum clock frequency of 10 MHz and supports a wide supply voltage range of 4.5V to 5.5V. Its robust design ensures reliable operation in demanding industrial and telecommunications environments.

Detailed Technical Specifications

Parameter Value
Part Number SN74ACT8990FNR
Manufacturer Texas Instruments (TI)
Package 44-PLCC (16.58x16.58 mm)
Supply Voltage (VCC) 4.5V to 5.5V
Maximum Clock Frequency 10 MHz
Operating Temperature Range -40°C to +85°C
Interface IEEE Std 1149.1 (JTAG)
Number of TAP Controllers 1
Output Drive Capability ±24 mA
Power Dissipation 1.1 W (max)

Key Features

  • Compliant with IEEE Std 1149.1-1990 boundary-scan standard
  • Supports test clock frequencies up to 10 MHz
  • Wide operating voltage range: 4.5V to 5.5V
  • Industrial temperature range: -40°C to +85°C
  • Compact 44-pin PLCC package for space-constrained designs
  • Low power consumption with high output drive
  • Direct interface to host processor via 8-bit parallel bus
  • Programmable test modes for flexible testing

Target Applications

The SN74ACT8990FNR is ideal for boundary-scan testing in complex digital systems. Specific applications include:

  • 5G base station control boards: used for testing high-speed digital interconnects and FPGA configurations
  • Automotive dashboard electronics: ensures reliable testing of infotainment and driver assistance modules
  • Industrial PLCs: facilitates in-system programming and fault diagnosis
  • Telecommunications switches: enables efficient testing of backplane and line card interfaces
  • Medical imaging equipment: supports boundary-scan testing of high-density PCBs

Global Supply Chain & Wholesale Solutions

At Jasin Chip, we provide professional supply chain and wholesale solutions for SN74ACT8990FNR. Our core advantages include:

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  • BOM Kitting & Sampling Services: Specialized sourcing for testing samples and urgent shortage components.

Quality Assurance & Compliance

Jasin Chip guarantees that all delivered products are 100% original factory stock with full quality assurance and traceability.

  • 100% Original & Authentic: All components are guaranteed to be authentic with strict quality control.
  • RoHS Compliant: All electronic components comply with international environmental and safety standards.
  • Original Factory Packaging: We maintain original factory packaging and seals to ensure ESD protection and physical integrity.

產品概述

SN74ACT8990FNR 是德州儀器(TI)推出的一款高性能測試匯流排控制器,專為符合 IEEE Std 1149.1 標準的邊界掃描測試設計。該器件在主處理器和目標板的測試存取埠(TAP)之間提供完整介面,實現數位電路的高效測試。採用 44 引腳 PLCC 封裝(16.58x16.58 mm),最高工作時脈頻率為 10 MHz,支援 4.5V 至 5.5V 的寬電源電壓範圍。其堅固的設計確保在工業和電信等嚴苛環境中可靠運行。

詳細技術參數

參數 數值
型號 SN74ACT8990FNR
製造商 德州儀器(TI)
封裝 44-PLCC(16.58x16.58 mm)
電源電壓(VCC) 4.5V 至 5.5V
最高時脈頻率 10 MHz
工作溫度範圍 -40°C 至 +85°C
介面 IEEE Std 1149.1(JTAG)
TAP 控制器數量 1
輸出驅動能力 ±24 mA
功耗 1.1 W(最大)

核心特性

  • 符合 IEEE Std 1149.1-1990 邊界掃描標準
  • 支援高達 10 MHz 的測試時脈頻率
  • 寬工作電壓範圍:4.5V 至 5.5V
  • 工業級溫度範圍:-40°C 至 +85°C
  • 緊湊的 44 引腳 PLCC 封裝,適合空間受限設計
  • 低功耗,高輸出驅動能力
  • 通過 8 位元並行匯流排直接與主處理器介面
  • 可程式設計測試模式,靈活測試

典型應用場景

SN74ACT8990FNR 適用於複雜數位系統的邊界掃描測試。具體應用包括:

  • 5G 基地台控制板:用於測試高速數位互連和 FPGA 配置
  • 汽車儀表板電子設備:確保資訊娛樂和駕駛輔助模組的可靠測試
  • 工業 PLC:便於系統內程式設計和故障診斷
  • 電信交換機:高效測試背板和線卡介面
  • 醫療影像設備:支援高密度 PCB 的邊界掃描測試

環球供應鏈與批發合作夥伴方案

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