SN74ACT8997DWR TI Test Equipment | 28-SOIC | 5V, 50MHz, JTAG

Product Overview

The SN74ACT8997DWR from Texas Instruments is a high-performance IEEE Std 1149.1 (JTAG) Test Access Port (TAP) controller designed for boundary-scan testing in complex digital systems. Housed in a 28-pin SOIC package, this device operates at 5V supply voltage and supports test clock frequencies up to 50MHz. It provides full JTAG compliance, enabling efficient testing of interconnects, opens, shorts, and logic faults on PCBs without physical probe access.

Detailed Technical Specifications

Key Features

• Full IEEE 1149.1 JTAG compliance for boundary-scan testing
• High-speed operation up to 50 MHz TCK
• 5V tolerant inputs and outputs
• Supports both serial and parallel test data paths
• Built-in self-test (BIST) capability
• Low power consumption with 500 mW max dissipation
• Industrial temperature range (-40°C to +85°C)
• 28-pin SOIC package for space-constrained designs

Target Applications

• 5G base station PCB testing and validation
• Automotive dashboard electronic control units (ECUs) boundary-scan
• Industrial automation PLC and motor drive testing
• Telecommunications switching equipment fault detection
• Medical imaging system board-level diagnostics
• High-reliability aerospace avionics testing

Global Supply Chain & Wholesale Solutions

At Jasin Chip, we provide professional supply chain and wholesale solutions for SN74ACT8997DWR. Our core advantages include:

• 24/7 Global Customer Support: Professional team providing instant quotes and technical support worldwide.
• In-stock Inventory, Same-day Shipping: We maintain localized stock; orders confirmed before 4 PM are shipped the same day.
• HK-SZ Synergy, Flexible Settlement: Direct global shipping from Shenzhen with support for HK bank transfers and multi-currency.
• Escrow Secured Transactions: We support Escrow.com for secure transactions, ensuring peace of mind for batch orders.
• BOM Kitting & Sampling Services: Specialized sourcing for testing samples and urgent shortage components.

Quality Assurance & Compliance

Jasin Chip guarantees that all delivered products are 100% original factory stock with full quality assurance and traceability.

• 100% Original & Authentic: All components are guaranteed to be authentic with strict quality control.
• RoHS Compliant: All electronic components comply with international environmental and safety standards.
• Original Factory Packaging: We maintain original factory packaging and seals to ensure ESD protection and physical integrity.

產品概述

SN74ACT8997DWR 是德州儀器 (TI) 推出的一款高性能 IEEE Std 1149.1 (JTAG) 測試訪問端口 (TAP) 控制器，專為複雜數字系統的邊界掃描測試而設計。該器件採用 28 引腳 SOIC 封裝，工作電壓為 5V，支持高達 50MHz 的測試時鐘頻率。它完全符合 JTAG 標準，能夠在無需物理探針的情況下高效測試 PCB 上的互連、開路、短路和邏輯故障。

詳細技術參數

核心特性

• 完全符合 IEEE 1149.1 JTAG 標準，支持邊界掃描測試
• 高速操作，TCK 頻率最高可達 50 MHz
• 5V 容限輸入和輸出
• 支持串行和並行測試數據路徑
• 內置自測試 (BIST) 功能
• 低功耗，最大功耗 500 mW
• 工業級溫度範圍 (-40°C 至 +85°C)
• 28 引腳 SOIC 封裝，適合空間受限的設計

典型應用場景

• 5G 基站 PCB 測試與驗證
• 汽車儀表盤電子控制單元 (ECU) 邊界掃描
• 工業自動化 PLC 和電機驅動測試
• 電信交換設備故障檢測
• 醫療影像系統板級診斷
• 高可靠性航空航天電子設備測試

環球供應鏈與批發合作夥伴方案

在 Jasin Chip，我們為 SN74ACT8997DWR 提供全面的供應鏈與批發解決方案。 我們的核心優勢包括：

• 全天候環球客戶支援：專業團隊為您提供即時報價及技術支援，無需漫長等待。
• 現貨庫存，即日發貨：確保現貨充足。下午 4 點前確認訂單，即可安排當天寄出。
• 深港聯動，結算靈活：深圳直發全球，物流高效可靠；支援香港銀行戶口轉賬及多幣種結算。
• Escrow 擔保交易：支援 Escrow.com 平台交易，保障買賣雙方權益，小批量訂單亦可安心在線下單。
• BOM 配單與樣板服務：提供樣板測試及認證支援。專注一站式 BOM 配套及緊急缺料採購服務。

品質保證與合規

Jasin Chip 承諾所有出貨產品均為原廠正貨，具備完善的品質保證及產品可追溯性。

• 100% 原廠正貨：承諾所有供應零件均為原裝現貨，品質嚴格把關，來源清晰可追溯。
• 符合 RoHS 認證：所有電子元器件均符合國際環保標準及相關安全認證。
• 原廠封裝保護：嚴格保留原廠原始包裝及封條，確保物流過程中的靜電防護 (ESD) 與物理安全。

以上產品均為原廠正貨，提供 BOM 配單及現貨庫存支援，歡迎查詢。

HONG KONG JASIN SEMICONDUCTOR TECHNOLOGY COMPANY LIMITED
Trusted Partner for Automotive, Industrial, and Hard-to-find Components.
WhatsApp: +852 5209 9691 | Email: [email protected]